Tanner, Brian K ORCID: 0000-0002-1474-177X, Danilewsky, Andreas and McNally, Patrick J.
ORCID: 0000-0003-2798-5121
(2022)
X-ray diffraction imaging of fully packaged n–p–n
transistors under accelerated ageing conditions.
Journal of Applied Crystallography, 55
.
pp. 1139-1146.
ISSN 0021-8898