O'Reilly, Lisa, Mitra, Anirban, Lucas, Francis Olabanji, Natarajan, Gomathi, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Daniels, Stephen ORCID: 0000-0002-5987-9924, Lankinen, Aapo, Lowney, Donnacha, Bradley, Ann Louise ORCID: 0000-0002-9399-8628 and Cameron, David C. (2007) Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications. Journal of Materials Science: Materials in Electronics, 18 (1). pp. 57-60. ISSN 1573-482X

Lowney, Donnacha (2006) Streaking and splashing: design of a grazing incidence x-ray streak camera and time-resolved measurements of the structure of water. PhD thesis, Dublin City University.

Lowney, Donnacha (2002) Analysis of the structural and optoelectronic properties of semiconductor materials and devices using photoacoustic spectroscopy and synchrotron x-ray topography. Master of Engineering thesis, Dublin City University.

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Rantamäki, R., Tuomi, Tiinamaija, Danilewsky, Andreas N., Lowney, Donnacha, Curley, John W. and Herbert, P.A.F. (2001) Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam x-ray topography. IEEE Transactions on Components and Packaging Technologies, 24 (1). pp. 76-83. ISSN 1521-3331

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Dilliway, G., Bonar, J.M., Willoughby, A., Tuomi, Tiinamaija, Rantamäki, R., Danilewsky, Andreas N. and Lowney, Donnacha (2000) On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge–Si heterostructure. Applied Physics Letters, 77 (11). ISSN 0003-6951