2022

Samimi, Mahdieh, Hosseinlaghab, Hassan, McCarthy, Éanna and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2022) Multi-messenger radio frequency and optical diagnostics of pulsed laser ablation processes. Journal of Manufacturing and Materials Processing, 6 (106). ISSN 2504-4494

Tanner, Brian K ORCID: 0000-0002-1474-177X, Danilewsky, Andreas and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2022) X-ray diffraction imaging of fully packaged n–p–n transistors under accelerated ageing conditions. Journal of Applied Crystallography, 55 . pp. 1139-1146. ISSN 0021-8898

Mussatto, Andre ORCID: 0000-0001-5335-7968, Groarke, Robert, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Obeidi, Muhannad A. ORCID: 0000-0003-2733-3828, MacLoughlin, Ronan ORCID: 0000-0002-3164-1607, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Nicolosi, Valeria ORCID: 0000-0002-7637-4813, Delauré, Yan ORCID: 0000-0002-7151-9278 and Brabazon, Dermot ORCID: 0000-0003-3214-6381 (2022) Laser-powder bed fusion in-process dispersion of reinforcing ceramic nanoparticles onto powder beds via colloid nebulisation. Materials Chemistry and Physics, 287 . ISSN 0254-0584

Mussatto, Andre ORCID: 0000-0001-5335-7968, Groarke, Robert, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Obeidi, Muhannad A. ORCID: 0000-0003-2733-3828, MacLoughlin, Ronan ORCID: 0000-0002-3164-1607, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Nicolosi, Valeria ORCID: 0000-0002-7637-4813, Delauré, Yan ORCID: 0000-0002-7151-9278 and Brabazon, Dermot ORCID: 0000-0003-3214-6381 (2022) Laser-powder bed fusion in-process dispersion of reinforcing ceramic nanoparticles onto powder beds via colloid nebulisation. Materials Chemistry and Physics, 287 . ISSN 0254-0584

Mussatto, Andre ORCID: 0000-0001-5335-7968, Groarke, Robert, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Obeidi, Muhannad A. ORCID: 0000-0003-2733-3828, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Nicolosi, Valeria ORCID: 0000-0002-7637-4813, Delauré, Yan ORCID: 0000-0002-7151-9278 and Brabazon, Dermot ORCID: 0000-0003-3214-6381 (2022) Laser-powder bed fusion of silicon carbide reinforced 316L stainless steel using a sinusoidal laser scanning strategy. Journal of Materials Research and Technology, 18 . pp. 2672-2698. ISSN 2238-7854

Mussatto, Andre ORCID: 0000-0001-5335-7968, Groarke, Robert, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Hughes, Cian ORCID: 0000-0002-4863-733X, Obeidi, Muhannad A. ORCID: 0000-0003-2733-3828, Doğu, Merve Nur ORCID: 0000-0003-1843-6040, Yalçin, Mustafa A., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Delauré, Yan ORCID: 0000-0002-7151-9278 and Brabazon, Dermot ORCID: 0000-0003-3214-6381 (2022) Assessing dependency of part properties on the printing location in laser-powder bed fusion metal additive manufacturing. Materials Today Communications, 30 . ISSN 2352-4928

2021

McCann, Ronán ORCID: 0000-0002-2071-0785, Ahmed Obeidi, Muhannad ORCID: 0000-0003-2733-3828, Hughes, Cian ORCID: 0000-0002-4863-733X, McCarthy, Éanna, Egan, Darragh ORCID: 0000-0003-2786-7379, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Joshi, Ajey ORCID: 0000-0003-3120-886X, Acinas Garzon, Victor, Dowling, Denis P. ORCID: 0000-0001-7853-2478, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and Brabazon, Dermot ORCID: 0000-0003-3214-6381 (2021) In-situ sensing, process monitoring and machine control in Laser Powder Bed Fusion: a review. Additive Manufacturing, 45 . ISSN 2214-8604

Sharif, Ayesha ORCID: 0000-0001-5604-1475, Farid, Nazar ORCID: 0000-0003-0556-6794, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and O'Connor, Gerard M. ORCID: 0000-0002-4577-1023 (2021) Femtosecond laser assisted crystallization of gold thin films. Journal of Nanomaterials, 11 (5). ISSN 2079-4991

Tanner, Brian K. ORCID: 0000-0002-1474-177X, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and Danilewsky, Andreas N. (2021) X-ray imaging of silicon die within fully packaged semiconductor devices. Powder Diffraction, 36 (2). pp. 78-84. ISSN 0885-7156

Farid, Nazar ORCID: 0000-0003-0556-6794, Sharif, Ayesha ORCID: 0000-0001-5604-1475, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Wang, M., Chan, H., Brunton, A., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Choy, K.L. and O'Connor, Gerard M. ORCID: 0000-0002-4577-1023 (2021) Improvement of electrical properties of ITO thin films by melt-free ultra-short laser crystallization. Journal Of Physics D-Applied Physics, 54 (18). ISSN 0022-3727

2020

Kaschel, F. R., Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Shmeliov, A., McCarthy, Éanna, Canavan, M., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Dowling, Dennis P. ORCID: 0000-0001-7853-2478, Nicolosi, Valeria ORCID: 0000-0002-7637-4813 and Celikin, M. (2020) Mechanism of stress relaxation and phase transformation in additively manufactured Ti-6Al-4V via in situ high temperature XRD and TEM analyses. Acta Materialia, 188 . pp. 720-732. ISSN 1359-6454

2019

Mussatto, Andre ORCID: 0000-0001-5335-7968, Groarke, Robert, A-Hameed, Ahmed, Ahad, Inam UI ORCID: 0000-0002-3802-6156, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, O’Neill, Aidan, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Delauré, Yan ORCID: 0000-0002-7151-9278 and Brabazon, Dermot ORCID: 0000-0003-3214-6381 (2019) Evaluation via powder metallurgy of nano-reinforced iron powders developed for selective laser melting applications. Materials & Design, 182 . ISSN 0261-3069

Tanner, Brian K. ORCID: 0000-0002-1474-177X, Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Roarty, Billy, Danilewsky, Andreas N. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2019) In-operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices. Microelectronics Reliability, 99 . pp. 232-238. ISSN 0026-2714

2017

Kelly, Seán ORCID: 0000-0002-8782-9633 and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2017) Remote sensing of a low pressure plasma in the radio near field. Applied Physics Express, 10 (9). 096101. ISSN 1882-0778

2016

Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Gaman, Cezar ORCID: 0000-0001-8588-8595, Jose, Bincy, McCoy, Anthony, Cafolla, Tony, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and Daniels, Stephen (2016) Pulsed plasma physical vapour deposition approach towards the facile synthesis of multilayer and monolayer graphene for anticoagulation applications. ACS Applied Materials and Interfaces, 8 (7). pp. 4878-4886. ISSN 1944-8244

2014

Wong, Chiu Soon, Bennett, N.S., Manessis, D., Danilewsky, Andreas N. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2014) Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages. Microelectronic Engineering, 117 . pp. 48-56. ISSN 0167-9317

2013

Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Daniels, Stephen, Rahman, Mahfujur, Cowley, Aidan and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2013) Deposition of earth-abundant p-type CuBr films with high hole conductivity and realization of p-CuBr/n-Si heterojunction solar cell. Materials Letters, 111 . pp. 63-66. ISSN 0167-577X

Moore, David, Rahman, Mahfujur, Dowling, Denis P. ORCID: 0000-0001-7853-2478, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and Brabazon, Dermot ORCID: 0000-0003-3214-6381 (2013) Laser machined macro and micro structures on glass for enhanced light trapping in solar cells. Applied Physics A: Materials Science & Processing, 110 (3). pp. 661-665. ISSN 1432-0630

Byrne, Daragh ORCID: 0000-0002-2040-9765, Cowley, Aidan, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and McGlynn, Enda ORCID: 0000-0002-3412-9035 (2013) Dellafossite CuAlO2 film growth and conversion to Cu–Al2O3 metal ceramic composite via control of annealing atmospheres. CrystEngComm, 15 . pp. 6144-6150. ISSN 1466-8033

2012

Wong, Chiu Soon, Bennett, N.S., Galiana, B., Tejedor, P., Benedicto, M., Molina-Aldareguia, J.M. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2012) Structural investigation of MOVPE-Grown GaAs on Ge by X-ray techniques. Semiconductor Science and Technology, 27 (11). p. 115012. ISSN 0268-1242

Foy, Barry, McGlynn, Enda ORCID: 0000-0002-3412-9035, Cowley, Aidan, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and Henry, Martin O. (2012) Study of exciton-polariton modes in nanocrystalline thin films of CuCl using reflectance spectroscopy. Journal of Applied Physics, 112 . 033505-033505. ISSN 1089-7550

Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Daniels, Stephen, McGlynn, Enda ORCID: 0000-0002-3412-9035, Gandhiraman, Ram Prasad, Groarke, Robert and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2012) Low temperature growth technique for nanocrystalline cuprous oxide thin films using microwave plasma oxidation of copper. Materials Letters, 71 . pp. 160-163. ISSN 0167-577X

2011

Moore, David, Krishnamurthy, Satheesh, Chao, Y., Wang, Q., Brabazon, Dermot ORCID: 0000-0003-3214-6381 and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2011) Characteristics of silicon nanocrystals for photovoltaic applications. physica status solidi a, 208 (3). pp. 604-607. ISSN 0031-8965

Allen, David, Stopford, Jennifer, Wittge, Jochen, Danilewsky, Andreas N. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2011) Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon. Journal Of Applied Crystallography, 44 (3). pp. 526-531. ISSN 0021-8898

2010

Foy, Barry, McGlynn, Enda ORCID: 0000-0002-3412-9035, Cowley, Aidan, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and Henry, Martin O. (2010) Spatially resolved investigation of the optical and structural properties of CuCl thin films on Si. In: American Institute of Physics Conference 2010, 8–10 Oct 2010, Strasbourg, France. ISBN 978-0-7354-0847-0

Wong, Chiu Soon, Bennett, N.S., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Galiana, B., Tejedor, P., Benedicto, M., Molina-Aldareguia, J.M., Monaghan, S., Hurley, Paul K. ORCID: 0000-0001-5137-721X and Cherkaoui, K. (2010) Multi-technique characterisation of MOVPE-grown GaAs on Si. Microelectronic Engineering, 88 (4). pp. 472-475. ISSN 0167-9317

Allen, David, Wittge, Jochen, Zlotos, A., Gorogostegui-Coinas, E., Garagorri, J., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Danilewsky, Andreas N. and Elizalde, M.R. (2010) Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-raman spectroscopy and white beam x-ray topography. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 268 (3-4). pp. 383-387. ISSN 0168-583x

Vijayaraghavan, Rajani K. ORCID: 0000-0003-1096-448X, Olabanji Lucas, Francis, Alam, Mohammad Jahangir, Daniels, Stephen and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2010) Zn doped nanocrystalline CuCl thin films for optoelctronic applications. MRS Proceedings, 1260 . ISSN 1946-4274

2008

Horan, Ken, Lankinen, Aapo, O'Reilly, Lisa, Bennett, N.S., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Sealy, B.J., Cowern, N.E.B. and Tuomi, Tiinamaija (2008) Structural and electrical characterisation of ion-implanted strained silicon. Materials Science and Engineering: B, 154-15 . pp. 118-121. ISSN 0921-5107

O'Reilly, Lisa, Horan, Ken, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Bennett, N.S., Cowern, N.E.B., Lankinen, Aapo, Sealy, B.J., Gwilliam, R.M., Noakes, T.C.Q. and Bailey, P. (2008) Constraints on micro-Raman strain metrology for highly doped strained Si materials. Applied Physics Letters, 92 (23). ISSN 1077-3118

2007

O'Reilly, Lisa, Mitra, Anirban, Lucas, Francis Olabanji, Natarajan, Gomathi, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Daniels, Stephen ORCID: 0000-0002-5987-9924, Lankinen, Aapo, Lowney, Donnacha, Bradley, Ann Louise ORCID: 0000-0002-9399-8628 and Cameron, David C. (2007) Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications. Journal of Materials Science: Materials in Electronics, 18 (1). pp. 57-60. ISSN 1573-482X

Chen, Weimin, McCloskey, Paul, Rohan, James F., Byrne, Patrick and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2007) Preparation and temperature cycling reliability of electroless Ni(P) under bump metallization. IEEE Transactions on Components and Packaging Technologies, 30 (1). pp. 144-151. ISSN 1521-3331

2006

Natarajan, Gomathi, Rajendra Kumar, Ramasamy Thangavelu, Daniels, Stephen, Cameron, David C. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2006) Stoichiometry control of sputtered CuCl thin films: Influence on ultraviolet emission properties. Journal of Applied Physics, 100 (9). ISSN 0021-8979

Bennett, N.S., Cowern, N.E.B., Smith, A.J., Gwilliam, R.M., Sealy, B.J., O'Reilly, Lisa, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Cooke, G. and Kheyrandish, H. (2006) Highly conductive Sb-doped layers in strained Si. Applied Physics Letters, 89 (18). ISSN 0003-6951

Natarajan, Gomathi, Daniels, Stephen ORCID: 0000-0002-5987-9924, Cameron, David C., O'Reilly, Lisa, Mitra, Anirban, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Lucas, Francis Olabanji, Rajendra Kumar, Ramasamy Thangavelu, Reid, Ian and Bradley, Ann Louise ORCID: 0000-0002-9399-8628 (2006) Growth of CuCl thin films by magnetron sputtering for ultraviolet optoelectronic applications. Journal of Applied Physics, 100 (3). ISSN 0021-8979

2005

O'Reilly, Lisa, Lucas, Francis Olabanji, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Reader, Alec, Natarajan, Gomathi, Daniels, Stephen, Cameron, David C., Mitra, Anirban, Martinez-Rosas, M. and Bradley, Ann Louise ORCID: 0000-0002-9399-8628 (2005) Room-temperature ultraviolet luminescence from ƴ-CuCl grown on near lattice-matched silicon. Journal of Applied Physics, 98 (11). ISSN 0021-8979

2004

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Kanatharana, Jarujit, Toh, B.H.W., McNeill, D.W., Danilewsky, Andreas N., Tuomi, Tiinamaija, Knuuttila, L., Riikonen, J., Toivonen, J. and Simon, R. (2004) Geometric linewidth and the impact of thermal processing on the stress regimes induced by electroless copper metallization for Si integrated circuit interconnect technology. Journal of Applied Physics, 96 (12). ISSN 0021-8979

Murphy, G., Whelan, Paul F. ORCID: 0000-0001-9230-7656, McNally, Patrick J., Tuomi, Tiinamaija and Simon, R. (2004) The use of neighbourhood intensity comparisons, morphological gradients and Fourier analysis for automated precipitate counting & Pendell¨osung fringe analysis in X-ray topography. European Physical Journal - Applied Physics (The), 27 (1-3). pp. 443-446. ISSN 1286-0042

2002

Dewan, Nasim Ahmed, McNally, Patrick J. ORCID: 0000-0003-2798-5121 and Herbert, P.A.F. (2002) Plasma modeling for a nonsymmetric capacitive discharge driven by a nonsinusoidal radio frequency current. Journal of Applied Physics, 91 (9). ISSN 0021-8979

2001

Islam, Md. Shafiqul and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (2001) Novel nonalloyed thermally stable Pd/Sn and Pd/Sn/Au ohmic contacts for the fabrication of GaAs MESFETs. IEEE Transactions on Electronic Devices, 48 (4). pp. 823-825. ISSN 0018-9383

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Rantamäki, R., Tuomi, Tiinamaija, Danilewsky, Andreas N., Lowney, Donnacha, Curley, John W. and Herbert, P.A.F. (2001) Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam x-ray topography. IEEE Transactions on Components and Packaging Technologies, 24 (1). pp. 76-83. ISSN 1521-3331

2000

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Dilliway, G., Bonar, J.M., Willoughby, A., Tuomi, Tiinamaija, Rantamäki, R., Danilewsky, Andreas N. and Lowney, Donnacha (2000) On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge–Si heterostructure. Applied Physics Letters, 77 (11). ISSN 0003-6951

1999

Rantamäki, R., Tuomi, Tiinamaija, Zytkiewicz, Z.R., Domagala, J. and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (1999) Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers. Journal of Applied Physics, 86 (8). ISSN 0021-8979

1998

Baric, Adrijan and McNally, Patrick J. ORCID: 0000-0003-2798-5121 (1998) A simple one-dimensional model for the explanation and analysis of GaAs MESFET behavior. IEEE Transactions on Education, 41 (3). pp. 219-223. ISSN 0018-9359

1996

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Tuomi, Tiinamaija, Herbert, P.A.F., Baric, Adrijan, Äyräs, P., Karilahti, M., Lipsanen, H. and Tromby, M. (1996) Synchrotron X-ray topographic analysis of the impact of processing steps on the fabrication of AlGaAs/InGaAs p-HEMT's. IEEE Transactions on Electron Devices, 43 (7). pp. 1085-1091. ISSN 1085-1091

McNally, Patrick J. ORCID: 0000-0003-2798-5121, Herbert, P.A.F., Tuomi, Tiinamaija, Karilahti, M. and Higgins, J.A. (1996) Analysis of the impact of dislocation distribution on the breakdown voltage of GaAs-based power varactor diodes. Journal of Applied Physics, 79 (11). ISSN 0021-8979