McNally, Patrick J. ORCID: 0000-0003-2798-5121, Kanatharana, Jarujit, Toh, B.H.W., McNeill, D.W., Danilewsky, Andreas N., Tuomi, Tiinamaija, Knuuttila, L., Riikonen, J., Toivonen, J. and Simon, R. (2004) Geometric linewidth and the impact of thermal processing on the stress regimes induced by electroless copper metallization for Si integrated circuit interconnect technology. Journal of Applied Physics, 96 (12). ISSN 0021-8979

Murphy, G., Whelan, Paul F. ORCID: 0000-0001-9230-7656, McNally, Patrick J., Tuomi, Tiinamaija and Simon, R. (2004) The use of neighbourhood intensity comparisons, morphological gradients and Fourier analysis for automated precipitate counting & Pendell¨osung fringe analysis in X-ray topography. European Physical Journal - Applied Physics (The), 27 (1-3). pp. 443-446. ISSN 1286-0042