Stopford, Jennifer (2012) Stresses and strain in silicon: 3-dimensional analytical capabilities for the non-invasive evaluation of strain fields in Si wafers and packaged chips. PhD thesis, Dublin City University.
Allen, David, Stopford, Jennifer, Wittge, Jochen, Danilewsky, Andreas N. and McNally, Patrick J. ORCID: 0000-0003-2798-5121
(2011)
Three-dimensional X-ray diffraction imaging of
process-induced dislocation loops in silicon.
Journal Of Applied Crystallography, 44
(3).
pp. 526-531.
ISSN 0021-8898
Phelan, Richard, Kelly, Brian, Jones, D., Herbert, C., O'Carroll, John, Rensing, Marc, Cai, B., Kaszubowska-Anandarajah, Aleksandra ORCID: 0000-0003-4811-9273, Perry, Philip, Stopford, Jennifer, Anandarajah, Prince M.
ORCID: 0000-0001-7335-8044, Barry, Liam P.
ORCID: 0000-0001-8366-4790 and O'Gorman, James
(2008)
Discrete mode laser diodes with ultra narrow linewidth emission <3kHz.
In: OFC/NFOEC 2008 - 2008 Conference on Optical Fiber Communication/National Fiber Optic Engineers Conference, 24-28 Feb 2008, San Diego, CA, USA.