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Tanner, Brian K. orcid logoORCID: 0000-0002-1474-177X, McNally, Patrick J. orcid logoORCID: 0000-0003-2798-5121 and Danilewsky, Andreas N. (2021) X-ray imaging of silicon die within fully packaged semiconductor devices. Powder Diffraction, 36 (2). pp. 78-84. ISSN 0885-7156

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